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Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.

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Newsletter

Analyze data from profilometry, microscopy & spectroscopy
With the software trusted by science & industry

MountainsLab® for multi-instrument compatibility

Ultimate surface analysis suite and point of confluence for data from any kind of instrument, the ideal solution for labs working with multiple types of microscopes

MountainsMap® for Profilometry

Surface analysis software for 3D optical profilers measuring topography, scanning 3D surface profilometers using contact or non-contact techniques and 2D profilometers

MountainsSEM® for Scanning Electron Microscopy

Visualization and analysis software for scanning electron microscopes (SEM) with tools for 3D reconstruction, colorization, particle analysis & volume electron microscopy (FIB-SEM, serial block-face SEM, array tomography etc.)

MountainsSPIP® for Scanning Probe Microscopy

Analysis software for scanning probe microscopy techniques including atomic force microscopy (AFM) and STM, MFM, SNOM, CSAFM, KPFM, etc.

MountainsSpectral® for Spectroscopy

Data processing and correlative analysis software for spectroscopic techniques (Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF etc.)

MountainsImage® for Light Microscopy

Image visualization & analysis software for light microscopes and other imaging systems producing B&W or color images without topography

Event

13 November

We are pleased to attend the next “Contrôle et Métrologie optique” conference taking place from November 13-14 in Bordeaux, France.

Digital Surf has been developing surface imaging & metrology software for profilers and microscopes since 1989

Our main focus is on working as a partner with instrument manufacturers worldwide, in the fields of surface metrology and microscopy. Mountains® software is now offered by the majority of profilometer and microscope manufacturers and is embedded in their equipment or available as an option.

Digital Surf also provides Mountains® software packages directly to instrument users. Mountains® has an installed base of 22,000+ licenses worldwide, is available in 11 languages, supports ISO and national metrology standards and is supplied by 50+ instrument manufacturers.

Application areas include: automotive, materials science, semiconductors, medical, aerospace, MEMS, renewable energy, etc.

Stories

Revealing key topographic parameters in surface bacterial adhesion

In the realm of dental implantology, understanding bacterial adhesion mechanisms is essential. Recent research led by Steve Papa and fellow researchers at the Jean Monnet University in Saint-Étienne, France, revealed the intricate relationship between surface topography and bacterial adhesion, with a particular focus on Porphyromonas gingivalis, a bacterium closely associated with dental implant failure.

Using microwear analysis to understand what T-rex ate

Dr. Mugino O. Kubo Ph.D at the University of Tokyo, Japan speaks about how her team are using three-dimensional microwear analysis and implementing new methods for studying the paleodiet of carnivorous dinosaurs, including the iconic Tyrannosaurus rex.

Learn surface metrology

Dive into our free online surface metrology guide and learn how to characterize surface texture in 2D and 3D using the right parameters and filters

Blog

3D reconstruction from 2D SEM images: a step-by-step guide

September 24, 2024

Learn more about 3D reconstruction from 2D scanning electron microscopy (SEM) images. This technique, powered by advanced analysis software solutions such as MountainsSEM®, transforms 2D SEM images into detailed 3D models, offering new insights on data in applications across a wide range of fields.