Newsletter
Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
Surface texture filtering has evolved with recent standards like ISO 25178 and ISO 21920, which introduced updated terminology. The traditional λs filter removed microroughness from profiles, but new concepts like the S-Filter and L-Filter now play distinct roles. In this article, François Blateyron clarifies the actions of each filter and explains how users can apply them correctly in metrological analysis.
Learn more about 3D reconstruction from 2D scanning electron microscopy (SEM) images. This technique, powered by advanced analysis software solutions such as MountainsSEM®, transforms 2D SEM images into detailed 3D models, offering new insights on data in applications across a wide range of fields.
The goal of this article is to highlight AFM image processing methods and analysis techniques including particle analysis (grain analysis), roughness analysis and force curve analysis and examine their fields of application.
Enter Mountains® surface and image analysis software no-code automation tools. Isabelle Cauwet, support and applications specialist, delves into how these software tools can boost your productivity.
Digital Surf’s senior surface metrology expert François Blateyron, new convener of working group WG16, shares insights on current projects and looks ahead to future advancements in the field of surface texture.
In this article François Blateyron, senior surface metrology expert at Digital Surf, discusses spectral analysis and why it is key to understanding surface texture analysis.
Observing a change in value of 0.1% between two versions of your analysis software does not necessarily mean that there is a bug. In this article François Blateyron discusses why results may vary and good practices to ensure they remain stable.
Learn more about the main changes in ISO 21920, a three-part standard published in Dec 2021 that modernizes, corrects and extends the three main international standards for profile parameters. François Blateyron, senior surface metrology expert at Digital Surf and member of ISO Technical Committee 213, explains.
One of the most common questions we receive from Mountains® users is: what cut-off value should I select to filter my data? The bad news is that there is no single answer. The good news is that our senior surface metrology expert, François Blateyron, has a few tips to help you make the right choice.
François Blateyron gives a short review of the main errors that authors should avoid in conference presentations and papers.
The combination of a high-pass filter and a low-pass filter may be used to establish a narrow bandwidth which can help to study surface behavior at a particular scale. François Blateyron provides further explanations on this type of filtering, a tool for which is released with Mountains® 9.2.
The GPS matrix is a convenient way of classifying standards in the various chain links of the specification-verification chain. François Blateyron provides further explanations.
Version 9 of Mountains® software sees the introduction of support for several new data types, including multi-channel cubes. Christophe Mignot, Digital Surf CEO, explains the nature of this new kind of “studiable” and highlights the main applications and advantages for users.
The next few months will see the validation of a revised version of the ISO 25178-2 standard, defining parameters and specifications for areal surface texture analysis . Digital Surf’s senior surface metrology expert François Blateyron outlines the changes to come.
Surface texture specifications are indicated using the root symbol. The new ISO 21920-1 series will soon bring changes that may modify common practices. Our senior metrology expert explains.
Stochastic and deterministic are two terms that are used more and more frequently to qualify modern surfaces. What is their meaning? Digital Surf’s senior metrology expert François Blateyron explains.
When results differ, which ones can be trusted? Proving that an algorithm is correct is not so straightforward. François Blateyron, senior expert on surface metrology, discusses this complex issue.
François Blateyron, Digital Surf’s expert on surface metrology, examines the next big change in surface analysis: freeform surfaces.
R&W motifs (ISO 12085) are soon to be included in the revision of profile standards (ISO 21290). François Blateyron, Digital Surf’s surface metrology expert explains.
With the release of Mountains® 8 comes the possibility to load and visualize a new kind of data, known as “Shells” or “Freeform surfaces”. Christophe Mignot takes a closer look at this new data type.
Surface texture has always been a difficult discipline to master, due to complex filtration conditions and numerous parameters. ISO expert François Blateyron looks how this could be simplified in the future.
Sometimes objects in SEM images are quite complex and you may have trouble colorizing them. Learn how to adjust settings of the click and color tool to colorize complex objects in SEM images.
A whole new world of 3D awaits users of scanning electron microscopy (SEM) coupled with Mountains® software. Christophe Mignot, Digital Surf CEO and specialist in SEM image analysis, runs through one of the coolest techniques available for bringing to life even the tiniest details contained in images.
The Stereoscopic Reconstruction operator available in Mountains® enables users to obtain a precise 3D model from a stereoscopic pair of SEM images in just a few seconds. However, before running this operator, there are a few things you need to know.
Most surface texture parameters are related to heights. But in some applications lateral features and their spacing are as (if not more) important.
Have you ever heard of the Sdr parameter? What if it turned out to be the ideal indicator for characterizing the functionality of your surface data?
Discover how to set up appropriate experimental conditions before imaging a sample to be used with the Mountains® SEM 3D reconstruction tool
Are you measuring surface roughness over an area? Ever wondered whether it is OK (or not) to compare values calculated (Sa, Sq, Sz etc.) with profile surface texture specifications (Ra, Rq, Rz etc.)? François Blateyron, Digital Surf's ISO surface metrology expert, sheds light on this issue which can easily cause confusion.
