In an exciting development for users of microscopy, profilometry and spectroscopy techniques, Digital Surf has just launched version 10.3 of its Mountains® analysis software. This update introduces a plethora of new features designed to enhance the platform’s analysis capabilities across various fields, from surface topography to spectral analysis.
Cross-technology features
One highlight of version 10.3 is the expansion of cross-technology features. Users can now rename numerical results using customizable aliases, simplifying the organization of data and allowing for easier retrieval and export.
The update also introduces a powerful Particle Analysis classification manager, designed to ensure reliability by minimizing human error and enabling seamless collaboration. Users can save and share classifications, facilitating reproducibility and data-sharing across teams or even between laboratories.
Another useful addition is the ability to set graduation scales to conform to publication standards, facilitating the preparation of scientific papers. Surface data can now be partitioned into several regions of interest by applying masks.
Above. New “Apply a mask” operator allows partitioning of surfaces, even if regions of interest have similar height values.
Features for profilometry
2D and 3D profilometry data analysis offers several important enhancements. Surface analysis now benefits from improvements to the Map local properties operator including new parameters such as surface variance and mean curvature.
Version 10.3 also sees improved tools for defect removal. Users can now correct outliers or asperities in series of profiles or surfaces more efficiently and access tools optimized for sloping or arc-shaped profiles.
Additionally, the new ball screw analysis feature allows detailed exploration of contour profiles measured on this type of mechanical component.
Improvements in power spectral density (PSD) analysis tools, which were initially launched in version 10.2, make multi-scale surface analysis even more intuitive. These tools now support ISO 10110-8 specification values and provide advanced visualization options.
Features for SEM
Version 10.3 debuts new functionalities for volume electron microscopy, particularly FIB-SEM and EDX cubes. These include 3D cutting planes for more dynamic visualizations. Users can notably select crop options, adjust plane positions, and set transparency levels.
Advanced correction tools for handling grayscale drift in data slices are also now available, enhancing precision in multi-channel cube analyses.
Above. Enhanced display and animation of materials in multi-channel cube data including volume electron microscopy data.
Features for spectroscopy
Spectral analysis workflows also get an upgrade in version 10.3. The release provides new pre-processing techniques tailored for photoluminescence and cathodoluminescence data. The Convert W-axis operator, new baseline correction methods and enhanced band analysis summaries make spectral data handling even more comprehensive.
Another noteworthy feature is the ability to convert images into spectral maps, which paves the way to more robust data pre-processing options Mountains® now also supports colocalization coefficient calculations, useful in fluorescence microscopy for quantifying overlap between cellular components.
Above. Colocalization coefficient calculations.
Features for SPM
Scanning Probe Microscopy (SPM) specialists will appreciate the introduction of line edge roughness (LER) analysis, a useful feature for those working in semiconductor fabrication, on topographical data. This feature allows quantification of the roughness of flanks on grooves, essential for process control.
Above. Calculate line edge roughness (LER) from topography.
Learn more & update
Access to the new version is included for users with an active Mountains® Software Maintenance Plan. To find out more about your Maintenance options, please contact sales@digitalsurf.com.