Strain plays a vital role in tailoring the electronic properties of semiconductor materials and devices to meet specific performance requirements. To quantify this phenomenon, Raman spectroscopy is particularly effective, as this technique is very sensitive and capable of probing small changes in the crystalline lattice
In Raman spectroscopy, strain is observed as a small shift, usually lower than 1cm-1 of some peaks, although generally speaking this kind of analysis can be quite complex.
In this webinar, Renata will demonstrate pre-processing and analysis of Raman spectroscopy data collected from a strained silicon chip using recently-released MountainsSpectral® software tools.
The webinar is aimed at current users of MountainsSpectral® software, anyone trying out the software and, more widely, at anyone analyzing spectral data (Raman, IR etc.) for industrial and research projects.
What you’ll see in this webinar:
Data visualization & pre-processing
- Zooming in on the region of interest
- Baseline correction
- Extracting an area to remove curves with no Raman signal
- Normalizing curves to correct “tilted” effect
Peak fitting
- Using peak fitting to calculate peak shift
Visualizing results
- Applying the Parameter map tool
- Resampling and processing the spectral image
This webinar is now available on-demand and you can watch it by clicking on the link below.
Duration: 30 minutes approx.
Speaker: Renata Lewandowska, Product Manager Spectral Applications @ Digital Surf
