What’s new in version 10.3?

 

Check out what’s new in this update!

• Cross-technology features
• Profilometry features
• SEM features
• Correlation & spectroscopy features
• SPM features

Cross-technology features

Rename results using aliases

A new, convenient way to tag numeric results and find them again easily

• Attribute a custom name to specific numeric results
• Select several results and create multiple aliases in one step
• Displayed in the Result manager, Table of results and in numeric exports

 

Particle Analysis: new classification manager

Save classifications for re-use or sharing with other users

• Guarantee reliability of classes by minimizing human error
• Exchange useful/complex classifications with colleagues without having to recreate them from scratch

 

Define graduation settings for profiles

• Set a fixed X- or Z-scale relative to the page to facilitate comparisons between profiles
• Define graduations to meet journal requirements for publications

 

Apply masks to partition surfaces

• Partition a surface into several regions of interest, even if they have similar height values
• Apply a mask created from the non-measured points of a surface or using the threshold of another surface

 

Other new features

• New Autoplace preference: choose to position new studies at the end of the document
• Display workflow showing all post-processing steps applied within the Particle Analysis study (e.g. Refine or Split/Merge)
• Display of Results tables has been optimized for large numbers of results (see below)

New features for profilometry

Improved Map local properties operator

• Curvature calculations have been accelerated and operator recall optimized
• New local curvature parameters: surface variance, mean curvature, curvedness, max/min curvature

 

Compare power spectral densities (PSD)

Improved usability of PSD tool introduced in v10.2

• Compare surfaces and profiles more easily
• Assemble power spectral densities from measurements at different scales for multi-scale analysis
• Display secondary axis in wavelength, use interactive cursors for RMS, set ISO10110-8 specification values etc.

 

Improved tools for defect removal

• Save time when working with series of profiles or surfaces by applying Remove outliers/asperities tools directly on the series (rather than having to generate each element of the series and process it individually)
• Visualize & remove defects on arc-shaped or sloping profiles with the Remove asperities and Retouch points operators

 

Ball screw analysis (multiple gothic arches)

• Quickly create a large number of gothic arches on a profile in the “Advanced contour” study
• Get valuable insights into how ball screws will function

 

Other improvements

• In the Scale-sensitive Fractal Analysis (SSFA) study, the assignment of colors to each element in a series allows easy comparison
• Users can now add parameters in add-on operators
• Contour study: result picker now available in Create oriented segment (see below)

 

New features for SEM

FIB-SEM/EDX cubes: cutting planes in 3D view

• New ”Blocks and planes” panel for enhanced display and animation of materials in multi-channel cube data
• Select crop options, set transparency threshold, move plane position using slider, display bounding box etc.

         

 

FIB-SEM cubes: correction tools for data slices

• Correct grayscale drift and other anomalies on each cross section, facilitating visualization and segmentation of structures
• New options for correcting slices when loading cube data to limit unnecessary post-processing: shift slices & correct drift

 

Other improvements

• View segmented data in 2D Pseudo-color view & display legend
• In the “Multi-channel cube analysis” study, results can now be calculated directly on segmented data, if available
• Create cube datasets from series of images

 

New features for correlation & spectroscopy

New methods for correcting spectra

New features for pre-processing spectral data, in particular for cathodoluminescence and photoluminescence

• New Convert W-axis operator: convert spectral axis and correct intensity
• New option for baseline correction: baseline in the form of a straight line, fitted on selected zones
• Subtract operator improved
• Multiply/Divide operator now works for spectral correction

 

Improved summary of spectral band analysis

• Visualize interactive colorized spectral bands in the Summary of current operator
• Change band position without having to recall the operator
• Display more information about bands: position, unit etc.

Convert images to spectral maps

• Convert RGB/grayscale images into spectral maps (non-topographic surfaces)
• Opens up new possibilities in data pre-processing and analysis
• Batch conversion and conversion of images with multiple channels is possible

 

Calculate colocalization coefficients

• In fluorescence microscopy, obtain numerical values expressing overlap (colocalization) of two sets of particles/cells
• Calculate Pearson’s Correlation Coefficient (PCC) and Mander’s Overlap Coefficient (MOC)

 

New features for SPM

Calculate line edge roughness (LER) on topography

• In semiconductor fabrication processes, quantify roughness of the flanks on grooves
• Calculate LER parameters for each edge line, LWR (line width roughness), pitch, and critical dimensions for each band

 

Learn more & update

Check the release notes for full details of the v10.3 release.

Access to this latest release is included in the Mountains® Software Maintenance Plan (SMP). Please visit our Software Updates page.
To find out more about SMP options, please contact sales@digitalsurf.com or visit this page.