The new Mountains® 10.3 version has just been launched. This update introduces a plethora of new features designed to enhance the platform’s analysis capabilities across various fields, from surface topography to spectral analysis. Read on to find out more.
- Cross-technology features
- Profilometry features
- SEM features
- Correlation & spectroscopy features
- SPM features
Cross-technology features
Rename results using aliases
A new, convenient way to tag numeric results and find them again easily
- Attribute a custom name to specific numeric results
- Select several results and create multiple aliases in one step
- Displayed in the Result manager, Table of results and in numeric exports
Particle Analysis: new classification manager
Save classifications for re-use or sharing with other users
- Guarantee reliability of classes by minimizing human error
- Exchange useful/complex classifications with colleagues without having to recreate them from scratch
Define graduation settings for profiles
- Set a fixed X- or Z-scale relative to the page to facilitate comparisons between profiles
- Define graduations to meet journal requirements for publications
Apply masks to partition surfaces
- Partition a surface into several regions of interest, even if they have similar height values
- Apply a mask created from the non-measured points of a surface or using the threshold of another surface
Other new features
- New Autoplace preference: choose to position new studies at the end of the document
- Display workflow showing all post-processing steps applied within the Particle Analysis study (e.g. Refine or Split/Merge)
- Display of Results tables has been optimized for large numbers of results (see below)
New features for profilometry
Improved Map local properties operator
- Curvature calculations have been accelerated and operator recall optimized
- New local curvature parameters: surface variance, mean curvature, curvedness, max/min curvature
Compare power spectral densities (PSD)
Improved usability of PSD tool introduced in v10.2
- Compare surfaces and profiles more easily
- Assemble power spectral densities from measurements at different scales for multi-scale analysis
- Display secondary axis in wavelength, use interactive cursors for RMS, set ISO10110-8 specification values etc.
Improved tools for defect removal
- Save time when working with series of profiles or surfaces by applying Remove outliers/asperities tools directly on the series (rather than having to generate each element of the series and process it individually)
- Visualize & remove defects on arc-shaped or sloping profiles with the Remove asperities and Retouch points operators
Ball screw analysis (multiple gothic arches)
- Quickly create a large number of gothic arches on a profile in the “Advanced contour” study
- Get valuable insights into how ball screws will function
Other improvements
- In the Scale-sensitive Fractal Analysis (SSFA) study, the assignment of colors to each element in a series allows easy comparison
- Users can now add parameters in add-on operators
- Contour study: result picker now available in Create oriented segment (see below)
New features for SEM
FIB-SEM/EDX cubes: cutting planes in 3D view
- New ”Blocks and planes” panel for enhanced display and animation of materials in multi-channel cube data
- Select crop options, set transparency threshold, move plane position using slider, display bounding box etc.
FIB-SEM cubes: correction tools for data slices
- Correct grayscale drift and other anomalies on each cross section, facilitating visualization and segmentation of structures
- New options for correcting slices when loading cube data to limit unnecessary post-processing: shift slices & correct drift
Other improvements
- View segmented data in 2D Pseudo-color view & display legend
- In the “Multi-channel cube analysis” study, results can now be calculated directly on segmented data, if available
- Create cube datasets from series of images
New features for correlation & spectroscopy
New methods for correcting spectra
New features for pre-processing spectral data, in particular for cathodoluminescence and photoluminescence
- New Convert W-axis operator: convert spectral axis and correct intensity
- New option for baseline correction: baseline in the form of a straight line, fitted on selected zones
- Subtract operator improved
- Multiply/Divide operator now works for spectral correction
Improved summary of spectral band analysis
- Visualize interactive colorized spectral bands in the Summary of current operator
- Change band position without having to recall the operator
- Display more information about bands: position, unit etc.
Convert images to spectral maps
- Convert RGB/grayscale images into spectral maps (non-topographic surfaces)
- Opens up new possibilities in data pre-processing and analysis
- Batch conversion and conversion of images with multiple channels is possible
Calculate colocalization coefficients
- In fluorescence microscopy, obtain numerical values expressing overlap (colocalization) of two sets of particles/cells
- Calculate Pearson’s Correlation Coefficient (PCC) and Mander’s Overlap Coefficient (MOC)
New features for SPM
Calculate line edge roughness (LER) on topography
- In semiconductor fabrication processes, quantify roughness of the flanks on grooves
- Calculate LER parameters for each edge line, LWR (line width roughness), pitch, and critical dimensions for each band
Learn more & update
Check the release notes for full details of the v10.3 release.
Access to this latest release is included in the Mountains® Software Maintenance Plan (SMP). Please visit our Software Updates page.
To find out more about SMP options, please contact sales@digitalsurf.com or visit this page.