Newsletter
Stay up to-date with the latest imaging, analysis and metrology news from Digital Surf.
Process & analyze spectra
Process spectral maps
Process & enhance images
Correlative Analysis
Left: colocalization of EDS maps, SEM image and AFM topography.
Visualize 2D compositional data in 3D
See composition of materials in full 3D
MountainsSpectral® Premium |
MountainsSpectral® Expert |
MountainsSpectral® Correlate |
MountainsSpectral® Analyze |
|
---|---|---|---|---|
Instrument compatibility |
Spectroscopic techniques: Raman, TERS, IR, nanoIR, fluorescence, photoluminescence, cathodoluminescence, EDX/EDS, XRF |
|||
Product features |
||||
Spectral map processing, enhancement & composition |
||||
Image correction & enhancement |
||||
Advanced processing & analysis of spectra |
||||
Topography analysis (i.e. based on AFM images) |
||||
High-quality overlays of compositional data on topography |
||||
Optional modules |
||||
Correlative Microscopy |
||||
Spectroscopy |
||||
Particle analysis |
Option | Option | ||
Multi-channel (chemical) cubes visualization & analysis |
Option | Option | ||
Fiber Analysis |
Option | Option | Option | |
IV Spectroscopy |
Option | Option | ||
Force Curve Analysis |
Option | Option | ||
Critical Dimensions & Trenches |
Option | |||
Support for Shells (freeform surfaces) |
Option |
The following range of optional modules for advanced and specialized applications is available with the MountainsSpectral® range.